Exhibitions & Conferences

Photonics West 2026

Photonics West 2026
Date
January 20 - 22, 2026
Booth#
637
Address
Moscone Center

747 Howard St
San Francisco, CA 94103
United States

Overview

SPIE Photonics West showcases the most cutting-edge research and products in photonics technologies. Visit Excelitas booth #637 to see our advanced, life-enriching technologies for the life sciences, advanced industrial, semiconductor and avionics markets.

Join Us for Our Presentations

  • A 1064 nm enhanced silicon APD for a free-running single photon counting module | Philippe Bérard | January 20: 3:40 PM - 4:00 PM PST
    Discover how Excelitas is pushing single-photon counting to 1064 nm with a new low-noise silicon APD—delivering high detection efficiency, fast recovery, and exceptional performance for advanced photonics applications.
     
  • Ranging beyond the coherence length with a MEMS tunable VCSEL | Bart C. Johnson | January 20: 4:15 PM - 4:30 PM PST
    Learn how frequency jitter in MEMS VCSELs can be corrected to enable meter-class LiDAR ranging, using an OCT-inspired approach that improves coherence and measurement accuracy.
     
  • System components for laser free confocal microscopy | Tony Wilson | January 21: 3:40 PM - 4:00 PM PST
    Gain insight into how confocal microscopy is advancing through structured illumination and detection. This presentation highlights a modern, laser-free approach to optical sectioning using advanced camera technology and non-laser light sources to achieve high-resolution, high-contrast imaging of thick specimens.
     
  • Improved recovery time in low-noise, high-gain InGaAs APDs | Ioan Bucsa | January 21: 6:00 PM - 8:00 PM PST
    Explore how conventional InGaAs APDs offer high gain and sensitivity but can suffer from long response tails that increase dead time, particularly at longer wavelengths. This presentation introduces a modified high-gain APD design with improved time resolution and reduced dead time, enabling enhanced performance for OTDR and LiDAR applications.
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